Quantifying the relationship between microbial attachment and mineral surface dynamics using vertical scanning interferometry (VSI)

on the relationship between using discourse markers and the quality of expository and argumentative academic writing of iranian english majors

the aim of the present study was to investigate the frequency and the type of discourse markers used in the argumentative and expository writings of iranian efl learners and the differences between these text features in the two essay genres. the study also aimed at examining the influence of the use of discourse markers on the participants’ writing quality. to this end the discourse markers us...

A comparison of vertical scanning interferometry (VSI) and atomic force microscopy (AFM) for characterizing membrane surface topography

In this paper, vertical scanning interferometry (VSI) and atomic force microscopy (AFM) were used to characterize the topography of several nanofiltration and reverse osmosis membrane surfaces. Comparing roughness results from the two different characterization techniques revealed u f o a m ©

the relationship between using language learning strategies, learners’ optimism, educational status, duration of learning and demotivation

with the growth of more humanistic approaches towards teaching foreign languages, more emphasis has been put on learners’ feelings, emotions and individual differences. one of the issues in teaching and learning english as a foreign language is demotivation. the purpose of this study was to investigate the relationship between the components of language learning strategies, optimism, duration o...

Improved vertical-scanning interferometry.

We describe a method that combines phase-shifting and coherence-peak-sensing techniques to permit measurements with the height resolution of phase-shifting interferometry without the interval-slope limitation of lambda/4 per data sample of phase-shifting interferometry. A five-frame algorithm is used to determine both the best-focus frame position and the fractional phase from the best-focus fr...

Phosphor-Based White Light Emitting Diode (LED) for Vertical Scanning Interferometry (VSI)